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Study Defines Expanded Purity Test Parameters for Photovoltaic Wafers

Elemental Analysis Inc. (http://www.elementalanalysis.com/study) provides test parameter data to aid silicon producers in evaluating the extended test application for industry production. By catching contamination early, companies can potentially reduce waste and improve production outputs.

Testing can turn around in as little as three days, speeding the process up substantially from current market wait times as long as three months.

Semiconductor, solar cell producers and nanotechnology firms are pushing for the highest accuracy test levels to insure purity of their products as they hit the markets.

"We can provide trace element testing to parts per quadrillion using our Neutron Activation Analysis techniques," states Mark Stauffer, of Elemental Analysis. "This 'ultra trace detection' capability enables our customers to take their products to market with full confidence that the purity levels required for performance are there."

To obtain a copy of the study, entitled "Purity Testing for Photovoltaic Wafers", visit the site at http://www.elementalanalysis.com) (EAI), a privately held company, provides all segments of industry with trace element analysis to determine product compositions and potential contamination levels. The company utilizes both non-destructive and state of the art forms of analytical chemistry with limits of detection ranging from sub-percent, to as low as parts-per-quadrillion.

Contact:

Mark Stauffer: (800) 563-7493

mstauffer @ elementalanalysis.com

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